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STUDIES ON K X-RAY FLUORESCENCE PARAMETERS OF LOW AND MEDIUM Z ELEMENTS

ANAND L., FRANCIS MARIA (2018) STUDIES ON K X-RAY FLUORESCENCE PARAMETERS OF LOW AND MEDIUM Z ELEMENTS. PhD thesis, Christ university.

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Abstract

K X-ray fluorescence parameters for pure elements have been determined using different single and double reflection geometry by several researchers over the years. Horakeri et al. have shown that the K X-ray fluorescence parameters can also be determined by a simple 2π-geometrical configuration method and a NaI(Tl) detector spectrometer for high Z elements. However, in order to study the K XRF parameters for low Z elements, high resolution detector spectrometers are required. But in high resolution detectors like HPGe and Si(Li), due to the gap between window and the active area of the detector, the solid angle subtended by the detector at the target is not 2π. Hence a suitable geometry correction is required for accurate measurement of incident photons and the emitted K X-ray photons in order to determine the K XRF parameters in low Z elements. In the present study, employing a nearly 2π-geometrical configuration and applying suitable geometry correction, we have determined the K X-ray fluorescence parameters of a few low and medium Z elements in the range of 27 ≤ Z ≤ 30 and 42 ≤ Z ≤ 47 respectively. The elements were procured in the form of thin foils and were irradiated by a weak radioactive source. The emitted K X-ray photons were detected using a low energy high resolution HPGe detector spectrometer. The incident photons, emitted K X-ray photons and the transmitted photons at the incident energy is measured and were corrected for window attenuation, efficiency, self-attenuation and geometry correction to obtain the true intensities of incident photons, emitted K Xray photons and the transmitted photons at the incident energy. From which the K XRF parameters like, K X-ray fluorescence yield, K X-ray fluorescence cross-section, ratio of the widths of radiative to radiationless (Auger) transitions of the K-shell, K Xray intensity ratio, K to L shell total vacancy transfer probability, total atomic attenuation cross-section, K X-ray jump factor and K X-ray jump ratio have been determined for Co, Ni, Cu, Zn, Mo, Pd, Ag, Pt, Au and Pb elements. The uncertainty associated with the K XRF parameters in the present values is systematically estimated. The values of the present work are tabulated along with the theoretical, semi-empirical and the reported values of others’ work. Since the measured values of K X-ray fluorescence parameters in the present work is on par with the theoretical, semi-empirical and the reported values of others’ work by different geometries, we, validate the methodology of a nearly 2π-geometrical configuration as a simple method with almost no radiation health risk to study the K X-ray fluorescence parameters of low Z pure elements. In this thesis we also present a few new work in the determination of K X-ray fluorescence yield and the K X-ray fluorescence cross- section.

Item Type:Thesis (PhD)
Subjects:Thesis
Thesis > Ph.D > Physics
Thesis > Ph.D
ID Code:7829
Deposited By:Shaiju M C
Deposited On:18 May 2019 09:14
Last Modified:18 May 2019 09:14

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